TH511/TH512/TH513

Product Description

The TECHMIZE TH511 Semiconductor C-V Analyzer is an integrated testing instrument designed for detailed C-V characteristic analysis and parasitic parameter measurement of semiconductor and power devices. It combines an LCR measurement system, VGS voltage source, VDS high-voltage source, switching matrix, and control software into a single unit, simplifying device testing and reducing complex external connections. The analyzer is suitable for testing MOSFETs, IGBTs, diodes, transistors, power semiconductor devices, and related components. It can measure important parasitic parameters such as Ciss, Coss, Crss, and Rg, allowing engineers to evaluate device characteristics and performance efficiently. TH511 supports a 1 kHz to 2 MHz test-frequency range with programmable test conditions and supports C-V curve analysis. Its 10.1-inch capacitive touchscreen provides a clear interface for measurement results, parameter settings, equivalent circuits, and test analysis. The system also supports spot testing and list scanning, with graphical scanning available as an option. With two standard test channels and optional expansion up to six channels, the TH511 is suitable for laboratory R&D, semiconductor characterization, production testing, and automated test applications. Its integrated design helps improve testing efficiency while reducing the need for multiple external instruments.