FLYING PROBE TESTER FA1823

Product Description

The FA1823 is an advanced flying probe tester designed for high-precision inspection of next-generation IC package substrates and high-density circuit boards. It enables accurate probing of ultra-fine pads and supports 4-terminal Kelvin low-resistance measurement, helping detect subtle resistance variations and improve inspection reliability. With four probe arms and high positioning precision, the FA1823 supports efficient double-sided testing for demanding semiconductor and electronics manufacturing applications. It is ideal for IC package substrates, semiconductor manufacturing, R&D, quality control, and mass production, where precise testing of fine-pitch pads is required.